NDLI: The NEC dependence of different scintillators for positron emission tomography

Content Provider	IEEE Xplore Digital Library
Author	Eriksson, L. Townsend, D. Eriksson, M. Casey, M.E. Conti, M. Bendriem, B. Nutt, R.
Copyright Year	2004
Description	Author affiliation: CPS Innovations, Knoxville, TN, USA (Eriksson, L.)
Abstract	In positron emission tomography (PET), the concept of noise equivalent count rate (NEC) is a measure of image quality. It has been shown that the local signal-to-noise ratio in the images reflects the global signal-to-noise ratio, which, in turn, can be related to the NEC. Factors that affect the NEC include the scanner geometry and scintillator material. The peak NEC has long been considered an indicator of PET scanner performance, whereas the sensitivity, represented by the slope of the NEC curve at the origin is equally important. This initial slope is proportional to the true coincidence sensitivity times the factor (1-SF), where SF is the scatter fraction. The peak NEC value is a strong function of scanner geometry and scintillator material, scatter fraction, system dead time and random coincidence fraction. The scatter fraction depends mainly on the low level discriminator setting of the system. Access to time-of-flight information may have a strong impact on the signal-to-noise properties and hence on the NEC performance. However, this work will focus specifically on the effect of the scintillator properties on the NEC, in particular the stopping power, light output, decay time and the interaction with the electronics. Three scintillators have been compared, the standard BGO, the fast high density LSO and a new fast, high light yield scintillator LaBr/sub 3/. The scintillators have been compared for the fixed scanner geometry of the ECAT EXACT.
Starting Page	3785
Ending Page	3788
File Size	716312
Page Count	4
File Format	PDF
ISBN	0780387007
ISSN	10823654
e-ISBN	0780387015
DOI	10.1109/NSSMIC.2004.1466704
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-10-16
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	National electric code Positron emission tomography Light scattering Solid scintillation detectors Signal to noise ratio Geometry Image quality Technological innovation Biomedical imaging Noise measurement
Content Type	Text
Resource Type	Article

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