NDLI: X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

Content Provider	IEEE Xplore Digital Library
Author	Ho Kyung Kim Sung Chae Jeon Gyuseong Cho Seong-Hoon Lim
Copyright Year	2002
Description	Author affiliation: Dept. of Nucl. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea (Ho Kyung Kim; Sung Chae Jeon; Gyuseong Cho)
Abstract	A lens-coupled CMOS detector has been tested for the application in X-ray laminography, which is a tomographic technique recently popular in the nondestructive inspection of printed circuit boards (PCBs). The lens-coupled CMOS detector is extremely cost-effective because of the simple configuration and the well-known CMOS technology. For the feasibility test, we have acquired X-ray images at various imaging conditions and analyzed them with respect to the system requirement. From the test results, although the projected image is reasonably acceptable to the normal nondestructive testing, it was concluded that the lens-coupling method is not appropriate to the laminography due to lowlight-collection efficiency. In this study, construction of the detector and its specification are described. Experimental results are reported with the discussion of the lens-coupling efficiency.
Starting Page	1620
Ending Page	1623
File Size	394420
Page Count	4
File Format	PDF
ISBN	0780373243
ISSN	10823654
DOI	10.1109/NSSMIC.2001.1008651
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-04
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray detection X-ray detectors Inspection Circuit testing Nondestructive testing X-ray imaging CMOS technology Tomography Printed circuits System testing
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Automatic PCB inspection systems

Photon counting energy dispersive detector arrays for x-ray imaging

Application of X-ray Computed Tomography to Automatic Wood Testing

Detection of defects at BGA solder joints by using X-ray imaging

An animated interface for X-ray laminographic inspection of fine-pitch interconnect

Development of a lens-coupled CMOS detector for an X-ray inspection system

Fault detection and visualization through micron-resolution X-ray imaging

Detection of plated through hole defects in printed circuit board with X-ray

Selected solutions in Printed Circuit Boards for silicon detector readout integrated circuits testing

X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

Similar Documents

Automatic PCB inspection systems

Photon counting energy dispersive detector arrays for x-ray imaging

Application of X-ray Computed Tomography to Automatic Wood Testing

Detection of defects at BGA solder joints by using X-ray imaging

An animated interface for X-ray laminographic inspection of fine-pitch interconnect

Development of a lens-coupled CMOS detector for an X-ray inspection system

Fault detection and visualization through micron-resolution X-ray imaging

Detection of plated through hole defects in printed circuit board with X-ray

Selected solutions in Printed Circuit Boards for silicon detector readout integrated circuits testing

X-ray laminographic application of lens-coupled CMOS detector for PCB inspection