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Development of a lens-coupled CMOS detector for an X-ray inspection system
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kim, Ho Kyung Ahn, Jung Keun Cho, Gyuseong |
| Copyright Year | 2005 |
| Abstract | A digital X-ray imaging detector based on a complementary metal-oxide-semiconductor (CMOS) image sensor has been developed for X-ray non-destructive inspection applications. This is a cost-effective solution because of the availability of cheap commercial standard CMOS image sensors. The detector configuration adopts an indirect X-ray detection method by using scintillation material and lens assembly. As a feasibility test of the developed lens-coupled CMOS detector as an X-ray inspection system, we have acquired X-ray projection images under a variety of imaging conditions. The results show that the projected image is reasonably acceptable in typical non-destructive testing (NDT). However, the developed detector may not be appropriate for laminography due to a low light-collection efficiency of lens assembly. In this paper, construction of the lens-coupled CMOS detector and its specifications are described, and the experimental results are presented. Using the analysis of quantum accounting diagram, inefficiency of the lens-coupling method is discussed. |
| Starting Page | 210 |
| Ending Page | 216 |
| Page Count | 7 |
| File Format | PDF HTM / HTML |
| DOI | 10.1016/j.nima.2005.01.310 |
| Alternate Webpage(s) | http://bml.pusan.ac.kr/Publication/PDF/IntJor/018-1_nima_05_v545_p210.pdf |
| Alternate Webpage(s) | https://doi.org/10.1016/j.nima.2005.01.310 |
| Volume Number | 545 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
