NDLI: Two-phase Fine-grain Sleep Transistor Insertion Technique in Leakage Critical Circuits

Content Provider	IEEE Xplore Digital Library
Author	Yu Wang Yongpan Liu Rong Luo Huazhong Yang Hui Wang
Copyright Year	2006
Description	Author affiliation: E.E. Dept., Tsinghua Univ., Beijing (Yu Wang; Yongpan Liu; Rong Luo; Huazhong Yang; Hui Wang)
Abstract	Multi-threshold CMOS is a valuable leakage reduction method in circuit standby mode. Reducing leakage current through fine-grain sleep transistor insertion (FGSTI) makes it easier to guarantee circuit functionality and improves circuit noise margins. In this paper, we first indicate the negligible dependence of ST size on the amount of leakage saving which makes the two-phase FGSTI reasonable based on our leakage current and delay models. Then we introduce a novel two-phase FGSTI technique: a) ST placement and b) ST sizing, which are formally modeled as two linear programming (LP) models respectively. Our experimental results show that the two-phase FGSTI technique can achieve 78.91%, 92.55%, 97.97% leakage saving when the circuit slowdown is 0%, 3%, 5% respectively. Comparing to the simultaneous ST placement and sizing method using mix integer linear programming (MLP) (Wang, 2006), our technique leads to on average 2% more leakage current reduction while at least 10times runtime saving since fewer variables and constraints with less approximation are used in the LP models. When the circuit slowdown is large enough to perform conventional fixed slowdown method, our technique can still achieve 75.48% ST area saving. Moreover, we show that when the circuit slowdown is 0%, it should be carefully considered to use FGSTI technique due to a large amount of leakage feedback gates
Sponsorship	ACM SIGDA IEEE Circuits and Syst. Soc
Starting Page	238
Ending Page	243
File Size	1358736
Page Count	6
File Format	PDF
ISBN	1595934626
DOI	10.1109/LPE.2006.4271843
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-04
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Sleep Leakage current Power dissipation Circuit noise Delay Linear programming Integer linear programming Runtime Feedback circuits Computer aided engineering mixed integer linear programming Algorithms Design Leakage current reduction two-phase fine-grain sleep transistor insertion
Content Type	Text
Resource Type	Article

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Two-Phase Fine-Grain Sleep Transistor Insertion Technique in Leakage Critical Circuits

Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits

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