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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Seng, F.C.K. Manaf, A.B.A. Lim Han Wooi |
| Copyright Year | 2011 |
| Description | Author affiliation: Intel Microelectronics (M) Sdn. Bhd., Bayan Lepas FTZ, Penang, Malaysia (Lim Han Wooi) || School of Electrical & Electronic Engineering, Universiti Sains Malaysia, 14300, Nibong Tebal, Penang, Malaysia (Seng, F.C.K.; Manaf, A.B.A.) |
| Abstract | The advancement of fabrication technology has doubled the silicon capacity every 18 months. Furthermore, design companies are trying to plug in advance and complex design on a system-on-a-chip (SoC). Yet, the time to implement such a complex design is very long. As a result, this widens the gap between silicon capacity and design productivity. In order to solve the productivity gap problem, this research is introducing a parameterized intellectual property (IP) reuse methodology framework in SoC design. This methodology improves the productivity, design quality and time-to-market of SoC design. The proposed methodology was tested using programmable interval timer (PIT). The results not only show this methodology has successfully reduced the entire IP power consumption and area utilization by 41.74% and 2.42% respectively, but also increase IP's portability, reusability. |
| Starting Page | 139 |
| Ending Page | 143 |
| File Size | 1281326 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781612848440 |
| e-ISBN | 9781612848464 |
| DOI | 10.1109/RSM.2011.6088310 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-09-28 |
| Publisher Place | Malaysia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Measurement Parameterize IP reuse Radiation detectors SoC Time-to-market Registers Power dissipation IP networks System-on-a-chip Hardware design languages Reconfiguration |
| Content Type | Text |
| Resource Type | Article |
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