NDLI: Temperature dependent current transport in Schottky diodes of nano structured ZnO grown on Si by magnetron sputtering

Content Provider	IEEE Xplore Digital Library
Author	Faraz, S.M. Khranovskyy, V. Yakimova, R. Ulyashin, A. Wahab, Q.
Copyright Year	2011
Description	Author affiliation: SINTEF Materials and Chemistry, Department of Energy Conversion and Materials, Forskningsveien, Oslo, Norway (Ulyashin, A.) \|\| Department of Electronic Engineering, NED University of Engineering and Technology, 75270, Karachi, Pakistan (Faraz, S.M.; Wahab, Q.) \|\| Departments of Physics, Chemistry and Biology, Linköpings University, SE-581 83, Linköping, Sweden (Khranovskyy, V.; Yakimova, R.)
Abstract	Nano-structured ZnO thin-film is grown by dc-magnetron sputtering on Si substrates using a sintered ZnO target. As grown film is characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). About 165 nm thick ZnO film is revealed with highly oriented, nano-structured columnar grains. Nickel (Ni) Schottky diodes are fabricated and characterized by current-voltage (I-V), capacitance-voltage (C-V) and temperature dependent current-voltage (I-V-T) measurements. Charge transport mechanism is studied from the I-V measurements performed in the temperature range from 300–400K. Both reverse and forward currents increased with temperature. Increase in barrier height along with a decrease in ideality factor with increasing temperature indicates thermionic field emission is the dominant charge transport mechanism in our devices.
Starting Page	48
Ending Page	51
File Size	544460
Page Count	4
File Format	PDF
ISBN	9781612848440
e-ISBN	9781612848464
DOI	10.1109/RSM.2011.6088289
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-28
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Schottky diodes Temperature dependence Temperature Current measurement Films Zinc oxide
Content Type	Text
Resource Type	Article

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