NDLI: On-Line Defect Detection in Web Offset Printing

Content Provider	IEEE Xplore Digital Library
Author	Shankar, N.G. Ravi, N. Zhong, Z.W.
Copyright Year	2003
Description	Author affiliation: Euro Technology Pte Ltd, Singapore (Shankar, N.G.)
Abstract	This paper presents a detailed description of a vision system developed to detect and locate the non-uniformities that appear on the web offset printing machine. Specifically, the system is capable of monitoring the high-speed web offset printing in a real time environment and alerting the operator of any events (e.g., structural faults, color variations, missing characters, ink splashes, streaks, etc.) that disrupt the uniformities in the web offset printing. Such events are thought to affect crucial printing properties, resulting in non-uniformities in printing and impacting its quality and printability. This paper describes the vision system in terms of its hardware modules, as well as the image processing algorithms that it utilizes to scan the color images and locate areas of defect from the printing web. Basically, the system utilizes high-speed image scanning algorithms to detect edges and boundaries using linear and non-linear filters of dynamic size, threshold and transformation for further analysis. In addition to being tested in a laboratory environment, a prototype of this system was constructed and deployed to a web printing system, where its performance was evaluated under realistic conditions. The system was installed on a Flexo gravure-print-press machine for testing, and it was found that the vision system was able to successfully monitor and detect non-uniformities.
Sponsorship	Lee Found. IEEE Montreal Sect. Candian Soc. Mechanical Eng
Starting Page	794
Ending Page	798
File Size	257810
Page Count	5
File Format	PDF
ISBN	078037777X
DOI	10.1109/ICCA.2003.1595132
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-06-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Machine vision Image edge detection System testing Printing machinery Monitoring Real time systems Ink Hardware Image processing Color Non-uniformities Web offset Color image Color image scanning Web printing
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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