NDLI: Extraction of circuit models for substrate cross-talk

Content Provider	IEEE Xplore Digital Library
Author	Smedes, T. van der Meijs, N.P. van Genderen, A.J.
Copyright Year	1997
Description	Author affiliation: Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands (Smedes, T.; van der Meijs, N.P.; van Genderen, A.J.)
Abstract	An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. The paper proposes a boundary element method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling during layout verification. In contrast to standard BE methods, we propose a Green's function which is specific to the domain and the problem. This allows minimal discretization and a direct extraction of circuit models for the cross-talk. The extraction can be combined with an efficient model reduction technique to obtain more simple, yet accurate models for the cross-talk. The complete extraction process has a linear time complexity and a constant memory usage. The method is fully implemented and integrated in an existing layout-to-circuit extractor.
Starting Page	199
Ending Page	206
File Size	812572
Page Count	8
File Format	PDF
ISBN	0818682000
ISSN	10636757
DOI	10.1109/ICCAD.1995.480013
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-11-05
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Coupling circuits Boundary element methods Integrated circuit interconnections Parasitic capacitance Mixed analog digital integrated circuits Design automation Numerical analysis Analytical models Circuit simulation Integrated circuit technology
Content Type	Text
Resource Type	Article

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