NDLI: Evolutionary optimization of Markov sources for pseudo random scan BIST

Content Provider	IEEE Xplore Digital Library
Author	Polian, I. Becker, B. Reddy, S.M.
Copyright Year	2003
Description	Author affiliation: Albert-Ludwigs-Univ., Freiburg Im Breisgau, Germany (Polian, I.; Becker, B.)
Abstract	Recent work by Basturkmen et al. (2002) showed that Markov sources lead to scan BIST designs of lower cost compared to earlier proposed methods in scan BIST. However the method presented by Basturkmen et al. utilizes tests generated using a deterministic test generator for target faults in synthesizing the Markov source to generate the tests. The requirement of a deterministic test generator may hinder the use of this procedure in industrial settings since the BIST tool must also include a deterministic ATPG tool that may add to the cost of the BIST tool. In this paper we investigate a procedure to synthesize BIST controllers with Markov sources for test generation using Evolutionary Algorithms (EAs). This allows us to avoid using the deterministic ATPG needed previously. Additionally we do not employ inversion logic used in by Basturkmen et al., thereby potentially reducing the hardware in the BIST controller. Nevertheless, the proposed method achieves close to 100% fault efficiency using far fewer tests than required by pseudo random tests. In this work, similar to that of Basturkmen et al., we employ Markov sources based on finite state machines (FSMs) with transitions controlled by additional inputs. Hence, transition probabilities (TPs) of the FSM are determined by the 1-probability on a corresponding input.
Sponsorship	EDAA EDA Consortium IEEE Comput. Soc. TTTC IEEE Comput. Soc. DATC ECSI ACM/SIGDA RAS
Starting Page	1184
Ending Page	1185
File Size	228733
Page Count	2
File Format	PDF
ISBN	0769518702
ISSN	15301591
DOI	10.1109/DATE.2003.1253792
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-03-07
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit faults Testing Electrical fault detection Fault detection Phase detection Costs Automatic test pattern generation Cities and towns Evolutionary computation
Content Type	Text
Resource Type	Article

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