NDLI: Fast wavelet-based single-particle reconstruction in Cryo-EM

Content Provider	IEEE Xplore Digital Library
Author	Vonesch, C. Lanhui Wang Shkolnisky, Y. Singer, A.
Copyright Year	2011
Description	Author affiliation: Program in Applied and Computational Mathematics, Princeton University, NJ, USA (Vonesch, C.; Lanhui Wang; Singer, A.) \|\| Department of Applied Mathematics, Tel Aviv University, Israel (Shkolnisky, Y.)
Abstract	This paper presents a novel algorithm for the 3D tomographic inversion problem that arises in single-particle electron cryomicroscopy (Cryo-EM). It is based on two key components: 1) a variational formulation that promotes sparsity in the wavelet domain and 2) the Toeplitz structure of the combined projection/back-projection operator. The first idea has proven to be very effective for the recovery of piecewise-smooth signals, which is confirmed by our numerical experiments. The second idea allows for a computationally efficient implementation of the reconstruction procedure, using only one circulant convolution per iteration.
Starting Page	1950
Ending Page	1953
File Size	142670
Page Count	4
File Format	PDF
ISBN	9781424441273
ISSN	19457928
DOI	10.1109/ISBI.2011.5872791
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-03-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image reconstruction Signal to noise ratio Three dimensional displays Fourier transforms Kernel Tomography non-uniform FFT Inverse problem electron cryo-microscopy (Cryo-EM) single particle reconstruction projection-slice theorem 3D wavelets sparsity one-norm regularization Toeplitz structure
Content Type	Text
Resource Type	Article

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