NDLI: Wavefront sensing for aberration modeling in fluorescence macroscopy

Content Provider	IEEE Xplore Digital Library
Author	Pankajakshan, P. Dieterlen, A. Engler, G. Kam, Z. Blanc-Feraud, L. Zerubia, J. Olivo-Marin, J.
Copyright Year	2011
Description	Author affiliation: Laboratoire MIPS-LAB.EL, Université de Haute-Alsace, 68093 Mulhouse, France (Dieterlen, A.) \|\| Molecular Cell Biology, Weizmann Institute of Science, Rehovot 76100, Israel (Kam, Z.) \|\| Quantitative Image Analysis Unit, Institut Pasteur, 75015 Paris, France (Pankajakshan, P.; Olivo-Marin, J.) \|\| IBSV Unit, INRA, 06903 Sophia Antipolis, France (Engler, G.) \|\| ARIANA Project-team, INRIA/CNRS/UNS, 06902 Sophia Antipolis, France (Blanc-Feraud, L.; Zerubia, J.)
Abstract	In this paper, we present an approach to calculate the wavefront in the back pupil plane of an objective in a fluorescent MACROscope. We use the three-dimensional image of a fluorescent bead because it contains potential pupil information in the ‘far’ out-of-focus planes for sensing the wavefront at the back focal plane of the objective. Wavefront sensing by phase retrieval technique is needed for several reasons. Firstly, the point-spread function of the imaging system can be calculated from the estimated pupil phase and used for image restoration. Secondly, the aberrations in the optics of the objective can be determined by studying this phase. Finally, the estimated wavefront can be used to correct the aberrated optical path without a wavefront sensor. In this paper, we estimate the wavefront of a MACROscope optical system by using Bayesian inferencing and derive the Gerchberg-Saxton algorithm as a special case.
Starting Page	905
Ending Page	908
File Size	298438
Page Count	4
File Format	PDF
ISBN	9781424441273
ISSN	19457928
DOI	10.1109/ISBI.2011.5872550
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-03-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Adaptive optics Optical imaging Microscopy Optical diffraction Optical sensors Bayes' theorem fluorescence MACROscopy phase retrieval field aberration Gerchberg-Saxton algorithm
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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