NDLI: Localizing the dermis/epidermis boundary in reflectance confocal microscopy images with a hybrid classification algorithm

Content Provider	IEEE Xplore Digital Library
Author	Kurugol, S. Dy, J.G. Rajadhyaksha, M. Brooks, D.H.
Copyright Year	2009
Description	Author affiliation: Dermatology Service, Memorial Sloan-Kettering Cancer Cent., 1275 York Ave., New York, USA (Rajadhyaksha, M.) \|\| ECE Dept., Northeastern University, 360 Huntington Ave., Boston, MA, USA (Kurugol, S.; Dy, J.G.; Brooks, D.H.)
Abstract	Confocal reflectance microscopy is an emerging modality, for dermatology applications, especially for in-situ and bedside detection of skin cancers. As this technology gains acceptance, automated processing methods become increasingly important to develop. Since the dominant internal feature of the skin is the epidermis/dermis boundary, it has been chosen as the initial target for this development. This boundary is a complex corrugated 3D layer marked by optically subtle changes and features. Indeed, even trained clinicians in an attempt at validation of our early work, were unable to precisely and reliably locate the boundary within optical resolution. Thus here we propose to detect two boundaries, a lower boundary for the epidermis and an upper boundary for the dermis thus trapping the epidermis/dermis boundary. We use a novel combined segmentation/classification approach applied to z-sequences of tiles in the 3D stack. The approach employs a sequential classification on texture features, selected via on-line feature selection, to minimize the labeling required and to cope with high inter- and intra-subject variability and low optical contrast. Initial results indicate the ability of our approach to find these two boundaries successfully for most of the z-sequences from the stack.
Starting Page	1322
Ending Page	1325
File Size	924605
Page Count	4
File Format	PDF
ISBN	9781424439317
ISSN	19457928
DOI	10.1109/ISBI.2009.5193308
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dermis Epidermis Reflectivity Microscopy Classification algorithms Skin Image segmentation Cancer Surface morphology Biomedical optical imaging sequence segmentation Confocal Microscopy locally smooth SVM
Content Type	Text
Resource Type	Article

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