NDLI: Laplacian Erosion: An Image Deblurring Technique for Multi-Plane Gamma-Cameras

Content Provider	IEEE Xplore Digital Library
Author	Brown, J.M.C. Gillam, J.E. Paganin, D.M. Dimmock, M.R.
Copyright Year	1963
Abstract	Laplacian Erosion, an image deblurring technique for multi-plane Gamma-cameras, has been developed and tested for planar imaging using a GEANT4 Monte Carlo model of the Pixelated Emission Detector for RadioisOtopes (PEDRO) as a test platform. A contrast and Derenzo-like phantom composed of ¹²⁵I were both employed to investigate the dependence of detection plane and pinhole geometry on the performance of Laplacian Erosion. Three different pinhole geometries were tested. It was found that, for the test system, the performance of Laplacian Erosion was inversely proportional to the detection plane offset, and directly proportional to the pinhole diameter. All tested pinhole geometries saw a reduction in the level of image blurring associated with the pinhole geometry. However, the reduction in image blurring came at the cost of signal to noise ratio in the image. The application of Laplacian Erosion was shown to reduce the level of image blurring associated with pinhole geometry and improve recovered image quality in multi-plane Gamma-cameras for the targeted radiotracer ¹²⁵I.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	3333
Ending Page	3342
Page Count	10
File Size	3320656
File Format	PDF
ISSN	00189499
Volume Number	60
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Laplace equations Phantoms Geometry Standards Image restoration Apertures Spatial resolution single photon emission imaging Image deblurring mechanical collimation
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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