NDLI: Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

Content Provider	IEEE Xplore Digital Library
Author	Cavrois, V.F. Pouget, V. McMorrow, D. Schwank, J.R. Fel, N. Essely, F. Flores, R.S. Paillet, P. Gaillardin, M. Kobayashi, D. Melinger, J.S. Duhamel, O. Dodd, P.E. Shaneyfelt, M.R.
Copyright Year	1963
Abstract	The propagation of single event transients (SET) is measured and modeled in SOI and bulk inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to determine the SET pulse width measured at the output of long chains of inverters after irradiation. Initially, narrow transients, less than 200 ps at the struck inverter, are progressively broadened into the nanosecond range. PIPB is induced by dynamic floating body effects (also called history effects) in SOI and bulk transistors, which depend on the bias state of the transistors before irradiation. Implications for SET hardness assurance, circuit modelling and hardening are discussed. Floating body and PIPB effects are usually not taken into account in circuit models, which can lead to large underestimation of SET sensitivity when using simulation techniques like fault injection in complex circuits.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	2842
Ending Page	2853
Page Count	12
File Size	590688
File Format	PDF
ISSN	00189499
Volume Number	55
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Pulse inverters Pulse width modulation inverters Laboratories Pulse measurements Circuit simulation Optical propagation Optical pulses Extraterrestrial measurements Single event upset History single event transients Chains of inverters heavy ions propagation induced pulse broadening pulsed laser
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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