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| Content Provider | ACM Digital Library |
|---|---|
| Author | Bhunia, Swarup Hashemian, Maryam S. Zheng, Yu |
| Abstract | Physical Unclonable Functions (PUFs) have emerged as an attractive primitive to address diverse hardware security issues in Integrated Circuits (ICs). A majority of existing PUFs rely on a dedicated circuit structure for generating chip-specific signatures, which often imposes concerns due to area/power overhead and extra design efforts. Furthermore, existing PUF-based signature generation cannot be employed to authenticate chips already in the market. In this paper, we propose RESP, a novel PUF structure realized in embedded SRAM array, a prevalent component in processors and system-on-chips (SOCs), with virtually no design modification. RESP leverages on voltage-depend memory access failures (during write) to produce large volume of high-quality challenge-response pairs. Since many modern ICs integrate SRAM array of varying size with isolated power grid, RESP can be easily retrofitted into these chips. Circuit-level simulation of 1000 chips using realistic process variation model shows high uniqueness of 49.2% average inter-die Hamming distance and good reproducibility of 2.88% intra-die Hamming distance under temperature < 85°C. The device aging effect, e.g. bias temperature instability (BTI), results in only 4.95% estimated unstable bits for ten-year usage. |
| Starting Page | 1 |
| Ending Page | 9 |
| Page Count | 9 |
| File Format | |
| ISBN | 9781450320719 |
| DOI | 10.1145/2463209.2488807 |
| Language | English |
| Publisher | Association for Computing Machinery (ACM) |
| Publisher Date | 2013-05-29 |
| Publisher Place | New York |
| Access Restriction | Subscribed |
| Subject Keyword | Puf Hardware security Bti Signature Sram |
| Content Type | Text |
| Resource Type | Article |
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