NDLI: X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case study.

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X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case study.

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X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case study.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	West, Bradley M. Stuckelberger, Michael Jeffries, April Gangam, Srikanth Lai, Barry Stripe, Benjamin Maser, Jörg Rose, Volker Vogt, Stefan Bertoni, Mariana I.
Description	Country affiliation: United States Author Affiliation: West BM ( School of Electrical, Computer, and Energy Engineering, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.); Stuckelberger M ( School of Electrical, Computer, and Energy Engineering, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.); Jeffries A ( School for Engineering of Matter, Transport, and Energy, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.); Gangam S ( School of Electrical, Computer, and Energy Engineering, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.); Lai B ( Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.); Stripe B ( Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.); Maser J ( Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.); Rose V ( Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.); Vogt S ( Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.); Bertoni MI ( School of Electrical, Computer, and Energy Engineering, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.)
Abstract	The study of a multilayered and multicomponent system by spatially resolved X-ray fluorescence microscopy poses unique challenges in achieving accurate quantification of elemental distributions. This is particularly true for the quantification of materials with high X-ray attenuation coefficients, depth-dependent composition variations and thickness variations. A widely applicable procedure for use after spectrum fitting and quantification is described. This procedure corrects the elemental distribution from the measured fluorescence signal, taking into account attenuation of the incident beam and generated fluorescence from multiple layers, and accounts for sample thickness variations. Deriving from Beer-Lambert's law, formulae are presented in a general integral form and numerically applicable framework. The procedure is applied using experimental data from a solar cell with a Cu(In,Ga)Se absorber layer, measured at two separate synchrotron beamlines with varied measurement geometries. This example shows the importance of these corrections in real material systems, which can change the interpretation of the measured distributions dramatically.
File Format	HTM / HTML
ISSN	09090495
Issue Number	Pt 1
Journal	Journal of Synchrotron Radiation
Volume Number	24
e-ISSN	16005775
Language	English
Publisher	IUCr
Publisher Date	2017-01-01
Publisher Place	United States
Access Restriction	Subscribed
Subject Keyword	Discipline Radiology
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Instrumentation Radiation

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