NDLI: Design of a prototype split-and-delay unit for XFEL pulses, and their evaluation by synchrotron radiation X-rays.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Sakamoto, Jun'ya Ohwada, Kenji Ishino, Masahiko Mizuki, Jun'ichiro Ando, Masami Namikawa, Kazumichi
Description	Country affiliation: Japan Author Affiliation: Sakamoto J ( School of Science and Technology, Kwansei Gakuin University, 2-1 Gakuen, Sanda, Hyogo 669-1337, Japan.); Ohwada K ( School of Science and Technology, Kwansei Gakuin University, 2-1 Gakuen, Sanda, Hyogo 669-1337, Japan.); Ishino M ( Department of Advanced Photon Research, Kansai Photon Science Institute, Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan.); Mizuki J ( School of Science and Technology, Kwansei Gakuin University, 2-1 Gakuen, Sanda, Hyogo 669-1337, Japan.); Ando M ( Tokyo University of Science, 6-3-1 Niijuku, Katsushika-ku, Tokyo 125-8585, Japan.); Namikawa K ( Tokyo Gakugei University, 4-1-1 Nukuikita-machi, Koganei, Tokyo 184-8501, Japan.)
Abstract	A prototype split-and-delay unit (SDU) for X-ray free-electron laser (XFEL) pulses is proposed based on the Graeff-Bonse four-Bragg-reflection interferometer by installing 12.5° slopes. The SDU can continuously provide a delay time from approximately -20 to 40âps with a resolution of less than 26âfs. Because the SDU was constructed from a monolithic silicon crystal, alignment is straightforward. The obtained thoroughputs of the SDU reached 0.7% at 7.46âkeV and 0.02% at 14.92âkeV. The tunability of the delay time using the proposed SDU was demonstrated by finding the interference effects of the split X-rays, and the time resolution of the proposed SDU was evaluated using the width of the interference pattern recorded on the X-ray charge-coupled device camera by changing the energy, i.e. longitudinal coherence length, of the incident X-rays. It is expected that the proposed SDU will be applicable to XFEL experiments using delay times from tens of femtoseconds to tens of picoseconds, e.g. intensity correlation measurements.
File Format	HTM / HTML
ISSN	09090495
Issue Number	Pt 1
Journal	Journal of Synchrotron Radiation
Volume Number	24
e-ISSN	16005775
Language	English
Publisher	IUCr
Publisher Date	2017-01-01
Publisher Place	United States
Access Restriction	Subscribed
Subject Keyword	Discipline Radiology
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Instrumentation Radiation

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