NDLI: Miniature diamond anvils for X-ray Raman scattering spectroscopy experiments at high pressure.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Petitgirard, Sylvain Spiekermann, Georg Weis, Christopher Sahle, Christoph Sternemann, Christian Wilke, Max
Description	Country affiliation: Germany Author Affiliation: Petitgirard S ( University of Bayreuth, Bayerisches Geoinstitut, Universitätsstrasse 30, Bayreuth, 95447, Germany.); Spiekermann G ( Universität Potsdam, Potsdam, Germany.); Weis C ( Fakultät Physik / DELTA, Technische Universität Dortmund, D-44221 Dortmund, Germany.); Sahle C ( European Synchrotron Radiation Facility, Grenoble, France.); Sternemann C ( Fakultät Physik / DELTA, Technische Universität Dortmund, D-44221 Dortmund, Germany.); Wilke M ( Universität Potsdam, Potsdam, Germany.)
Abstract	X-ray Raman scattering (XRS) spectroscopy is an inelastic scattering method that uses hard X-rays of the order of 10âkeV to measure energy-loss spectra at absorption edges of light elements (Si, Mg, O etc.), with an energy resolution below 1âeV. The high-energy X-rays employed with this technique can penetrate thick or dense sample containers such as the diamond anvils employed in high-pressure cells. Here, we describe the use of custom-made conical miniature diamond anvils of less than 500âµm thickness which allow pressure generation of up to 70âGPa. This set-up overcomes the limitations of the XRS technique in very high-pressure measurements (>10âGPa) by drastically improving the signal-to-noise ratio. The conical shape of the base of the diamonds gives a 70° opening angle, enabling measurements in both low- and high-angle scattering geometry. This reduction of the diamond thickness to one-third of the classical diamond anvils considerably lowers the attenuation of the incoming and the scattered beams and thus enhances the signal-to-noise ratio significantly. A further improvement of the signal-to-background ratio is obtained by a recess of â¼20âµm that is milled in the culet of the miniature anvils. This recess increases the sample scattering volume by a factor of three at a pressure of 60âGPa. Examples of X-ray Raman spectra collected at the O K-edge and Si L-edge in SiO glass at high pressures up to 47âGPa demonstrate the significant improvement and potential for spectroscopic studies of low-Z elements at high pressure.
File Format	HTM / HTML
ISSN	09090495
Issue Number	Pt 1
Journal	Journal of Synchrotron Radiation
Volume Number	24
e-ISSN	16005775
Language	English
Publisher	IUCr
Publisher Date	2017-01-01
Publisher Place	United States
Access Restriction	Subscribed
Subject Keyword	Discipline Radiology
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Instrumentation Radiation

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