NDLI: CDS circuit with BLA function for X-ray CCD applications

Content Provider	IET Digital Library
Author	Lu, Bo Chen, Yong Luo, Jiajun Zhou, Yumei
Abstract	Correlated double sampling (CDS) circuits are essential to process the X-ray charge-coupled devices (CCDs) that have been used in the modern X-ray astronomical field. A novel CDS circuit is presented. The innovation of the circuit is that it greatly improves the noise and linearity performances through moving the clamping switch out of the signal path as well as omitting the sampling switch which eliminates the nonlinearity and thermal noise introduced by these switches. Also, a baseline adjustment (BLA) circuit is incorporated so as to make efficient use of the dynamic range of the ADC, making the CDS circuit flexible to interface the CCD operating under a wide range of temperatures. A prototype application-specific integrated circuit (ASIC) is designed with GlobalFoundries 0.35 μm CMOS process and the experimental results show that with pixel rate varying from 100 kHz to 1 MHz, the integral nonlinearity and equivalent input noise performances are quite consistent, which are better than 27 ppm and 23 μV, respectively, within a dynamic range of 1.5 Vpp. The effective adjustment range of the BLA is at least 2 V, and the power consumption for a single CDS core is 10 mW approximately from a 3.3 V power supply.
Starting Page	770
Ending Page	772
Page Count	3
ISSN	00135194
Volume Number	53
e-ISSN	1350911X
Issue Number	Issue 12, Jun (2017)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/el/53/12
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/el.2017.0702
Journal	Electronics Letters
Publisher Date	2017-05-09
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Application Specific Integrated Circuit ASIC Baseline Adjustment Circuit BLA Circuit BLA Function CDS Circuit Charge-Coupled Device Clamping Switch CMOS Integrated Circuit Correlated Double Sampling Circuit Equivalent Input Noise Performance Field Effect Device Frequency 100 KHz to 1 MHz GlobalFoundries CMOS Process Integral Nonlinearity Mixed Analogue-digital Circuit Pixel Rate Power 10 MW Power Consumption Sampling Switch Signal Path Size 0.35 Mum Thermal Noise Voltage 3.3 V X-Ray And Gamma-ray Equipment X-Ray Astronomical Field X-Ray CCD Application X-Ray Charge-coupled Device X-Ray Detection
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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