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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chung, S.I. Lee, H.H. |
| Copyright Year | 2008 |
| Description | Author affiliation: Dept. of Electr. Eng., Chung-Nam Nat. Univ., Daejeon (Chung, S.I.; Lee, H.H.) |
| Abstract | This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged particles drifting toward the south pole and the north pole through cyclic movement. In particular, SEU (single event upset) by radiation causes the malfunction of semiconductor elements in satellites. The present study irradiated an electron beam on solar cells using a 1 MeV electron beam accelerator and measured the values of parameters changed by the irradiation. In addition, we made comparative analysis with ground experiment using variation in short circuit current measured at solar cells for the attitude control of STSAT-1 and electron flux observed in the NOAA POES Satellite. The results of this study are expected to be useful in understanding the impact of radiation on solar cells for power generation in low altitude satellites. |
| Starting Page | 700 |
| Ending Page | 702 |
| File Size | 252797 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424421701 |
| ISSN | 19354576 |
| DOI | 10.1109/INDIN.2008.4618191 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-07-13 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Content Type | Text |
| Resource Type | Article |
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