NDLI: A High-speed AFM Scanning Mode Based on Learning Control

Content Provider	IEEE Xplore Digital Library
Author	Fang Yongchun
Copyright Year	2007
Description	Author affiliation: Nankai Univ., Tianjin (Fang Yongchun)
Abstract	Atomic force microscopy (AFM) is a main instrument for nano-scale measurement and manipulation. This paper proposes a learning control based high-speed scanning mode for an AFM system. Specifically, a learning-based control scheme is designed for the AFM system, which consists of an optimal inverse compensator for the AFM scanner dynamics, and a learning algorithm attacking the surface profile of the detected sample. Then, based on the observation of the offset among neighboring scanning lines, the aforementioned learning-based control scheme is combined with a conventional proportional-integral (PI) controller to achieve a high-speed AFM scanning mode. For periodic samples, this mode can be utilized to largely increase the measurement speed and precision, and simultaneously maintains the distance between the cantilever tip and the detected sample within a reasonable range to avoid the possible harm to them. Therefore, the proposed high-speed scanning mode can be employed for on-line inspection of fast biologic processes, and it can also be utilized to implement such nano-manipulation as repetitive writing.
Starting Page	815
Ending Page	819
File Size	614940
Page Count	5
File Format	PDF
ISBN	9787811240559
DOI	10.1109/CHICC.2006.4347397
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-07-26
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic measurements Atomic force microscopy Force measurement Instruments Control systems Atomic Force Microscopy Nanobioscience Learning control Proportional control Optimal control High-speed scanning mode Pi control Force control Optimal inverse control
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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