NDLI: Precisely controlling the duration of fault injection campaigns: a Statistical view

Content Provider	IEEE Xplore Digital Library
Author	Leveugle, R. Calvez, A. Vanhauwaert, P. Maistri, P.
Copyright Year	2009
Description	Author affiliation: TIMA Laboratory (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet - 38031 Grenoble Cedex - France (Leveugle, R.; Calvez, A.; Vanhauwaert, P.; Maistri, P.)
Abstract	Fault injection has become the main approach to evaluate the dependability of a circuit with respect to soft errors. It can be applied early during the design process and refined along all design steps. However, the main limitation is the huge number of faults that should be injected when large circuits and/or complex workloads and complex error models are considered. This usually leads to practical campaigns based on a randomly selected subset of all potential faults. However, results obtained in these conditions are only estimations and the error on the estimation is never quantified in the literature. This paper presents an approach to quantify both the error on the presented results and the confidence on the computed error interval. Conversely, the computation of the required number of faults to inject in order to achieve a given confidence and error interval is also discussed. Experimental results are shown, fully supporting the presented approach.
Starting Page	149
Ending Page	154
File Size	8266238
Page Count	6
File Format	PDF
ISBN	9781424443208
DOI	10.1109/DTIS.2009.4938045
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-06
Publisher Place	Egypt
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Process design Circuit simulation Emulation Laboratories Hardware Circuit faults Acceleration Circuit analysis Indium phosphide Clocks
Content Type	Text
Resource Type	Article

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