NDLI: An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm

Content Provider	IEEE Xplore Digital Library
Author	McCaffrey, J.D.
Copyright Year	2010
Abstract	Pairwise test set generation is the process of producing a subset of all possible test case inputs to a system in situations where exhaustive testing is not possible or is prohibitively expensive. For a given system under test with a set of input parameters where each parameter can take on one of a discrete set of values, a pairwise test set consists of a collection of vectors which capture all possible combinations of pairs of parameter values. Generating pairwise test sets with a minimal size has been shown to be an NP-complete problem, and several deterministic generation algorithms have been published. This paper describes the results of an investigation of pairwise test set generation using a genetic algorithm. The genetic algorithm approach produced pairwise test sets with comparable or smaller (better) size compared with published results for deterministic algorithms for 39 out of 40 benchmark problems. However, the genetic algorithm test set generation technique required significantly longer processing time in all cases. The results illustrate that generation of pairwise test sets using a genetic algorithm is possible, and suggest that the technique may be both practical and useful in certain software testing situations.
Starting Page	992
Ending Page	997
File Size	553184
Page Count	6
File Format	PDF
ISBN	9781424462704
e-ISBN	9781424462711
DOI	10.1109/ITNG.2010.93
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing System testing software testing Software quality Benchmark testing genetic algorithms software quality Information technology Combinatorial mathematics pairwise testing Genetic algorithms
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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