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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shanshan Dai Rosenstein, J.K. |
| Copyright Year | 2015 |
| Description | Author affiliation: Sch. of Eng., Brown Univ., Providence, RI, USA (Shanshan Dai; Rosenstein, J.K.) |
| Abstract | A novel integrated current measurement system with ultra wide dynamic range is presented and fabricated in a 180-nm CMOS technology. Its dual-mode design provides concurrent voltage and frequency outputs, without requiring an external clock source. An integrator-differentiator core provides a voltage output with a noise floor of 11.6 f Arms /√Hz and a measurement bandwidth of 1.4 MHz. This is merged with an asynchronous current-to-frequency converter (CFC), which generates an output frequency linearly proportional to the input current. Together, the voltage and frequency outputs yield a current measurement range of 155-dB, spanning from 204 fA to 11.6 μA. The proposed architecture's low noise, wide bandwidth, and wide dynamic range make it ideal for measurements of ion channels, nanopores, tunneling junctions, and other nanosensors. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 1592474 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781479972340 |
| DOI | 10.1109/BioCAS.2015.7348404 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-10-22 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Voltage measurement current to frequency converter Capacitors Dynamic range current recording nanosensors low noise Frequency measurement Noise measurement analog front end Current measurement Bandwidth wide dynamic range |
| Content Type | Text |
| Resource Type | Article |
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