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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Krishnan, A. Kelly, S.K. |
| Copyright Year | 2015 |
| Description | Author affiliation: VA Pittsburgh, Pittsburgh, PA, USA (Kelly, S.K.) || Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA (Krishnan, A.) |
| Abstract | Current technology has enabled a significant increase in the number of electrodes for electrical stimulation. For large arrays of electrodes, it becomes increasingly difficult to monitor and detect failures at the stimulation site. In this paper, we propose the idea that the residual voltage from a biphasic electrical stimulation pulse can serve to recognize damage at the electrode-tissue interface. We use a simple switch circuit approach to estimate the relaxation time constant of the electrode model, which essentially models the residual voltage in biphasic electrical stimulation, and compare it with standard electrode characterization techniques. Out of 15 electrodes in a polyimide-based SIROF array, our approach highlights 3 damaged electrodes, consistent with measurements made using cyclic voltammetry and electrode impedance spectroscopy. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 928566 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781479972340 |
| DOI | 10.1109/BioCAS.2015.7348354 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-10-22 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrodes Resistance Voltage measurement Current measurement Electrical resistance measurement Mathematical model Integrated circuit modeling |
| Content Type | Text |
| Resource Type | Article |
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