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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhao, Y. Basaran, C. Cartwright, A. Dishongh, T. |
| Copyright Year | 2000 |
| Description | Author affiliation: Electron. Packaging Lab., State Univ. of New York, Buffalo, NY, USA (Zhao, Y.) |
| Abstract | Recent trends in reliability and fatigue life analysis of electronic devices have involved developing structural integrity models for predicting the operating lifetime under vibratory and thermal environmental exposure. Solder joint reliability is the most critical issue for the structural integrity of surface mounted electronics. Extensive research has been done on thermal behavior of solder joints, however, dynamic loading effects on solder joint fatigue life have not been thoroughly investigated. The physics of solder joint failure under vibration is still not very clear. This paper presents a test program which was performed to study inelastic behavior of solder joints of BGA packages. A concurrent loading unit is used which consists of a thermal environmental chamber and an electrodynamic shaker. Laser Moire Interferometry was used to measure the whole deformation field of the prepared specimen surface. The corresponding inelastic strain field is then calculated. It is found that at elevated temperature, vibration and shock can cause the accumulation of inelastic strains and damage in solder joints. In this paper, contrary to the popular belief that all vibration-induced strains are elastic, it is shown that vibration can cause significant inelastic strains. |
| Starting Page | 349 |
| Ending Page | 355 |
| File Size | 680763 |
| Page Count | 7 |
| File Format | |
| ISBN | 0780359127 |
| ISSN | 10899870 |
| DOI | 10.1109/ITHERM.2000.866213 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-05-23 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Thermomechanical processes Soldering Capacitive sensors Fatigue Electronic packaging thermal management Thermal loading Predictive models Physics Testing Performance evaluation |
| Content Type | Text |
| Resource Type | Article |
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