NDLI: Estimating defect-type distributions through volume diagnosis and defect behavior attribution

Content Provider	IEEE Xplore Digital Library
Author	Xiaochun Yu Blanton, R.D.
Copyright Year	2010
Description	Author affiliation: Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, U.S.A. (Xiaochun Yu; Blanton, R.D.)
Abstract	We propose a methodology that effectively estimates the defect-type distribution that affects a design fabricated in a given manufacturing process. Understanding the distribution can improve design quality, test quality, and the manufacturing process itself. The methodology is composed of i) an improved approach for identifying the signal lines relevant to defect activation at each site reported by diagnosis, ii) a new behavior attribution method, and iii) a novel approach to estimate the defect-type distribution. The efficacy of this methodology is validated using circuit-level simulation experiments. The results show that the method achieves an average accuracy of 94% in identifying signal lines that are relevant to the activation of a defect. When estimating defect-type distribution for a population affected by a variety of defects, the average estimation accuracy is 92% with ideal diagnosis. With a realistic diagnosis (i.e., the inherent ambiguity of diagnosis is accounted for), the estimated defect-type distribution is 85% accurate, on average.
Starting Page	1
Ending Page	10
File Size	555148
Page Count	10
File Format	PDF
ISBN	9781424472062
ISSN	10893539
e-ISBN	9781424472079
DOI	10.1109/TEST.2010.5699270
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-11-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Bridge circuits Circuit faults Entropy Fault diagnosis Accuracy Integrated circuit modeling Benchmark testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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