NDLI: Improving fault diagnosis accuracy by automatic test set modification

Content Provider	IEEE Xplore Digital Library
Author	Amati, L. Bolchini, C. Salice, F. Franzoso, F.
Copyright Year	2010
Description	Author affiliation: Politecnico di Milano, Dipartimento di Elettronica e Informazione, Italy (Amati, L.; Bolchini, C.; Salice, F.) \|\| Cisco Photonics, Monza, Italy (Franzoso, F.)
Abstract	Fault diagnosis is the task of identifying a faulty component in a complex system using data collecting from a test section. Diagnostic resolution, that is the ability to discriminate a faulty component in a set of possible candidates, is a property that the system model must expose to provide accuracy and robustness in the diagnosis. Such a property depends on the selection of an appropriate test set capable to provide a unique interpretation of the test outcomes. In this paper a quantitative metric for the evaluation of diagnostic resolution of a test set is proposed, together with an algorithm for the minimal extension of a given test set in order to provide a complete discrimination of failures affecting a system, to be used as a support for analysts during the definition of a testing framework.
Starting Page	1
Ending Page	8
File Size	1266974
Page Count	8
File Format	PDF
ISBN	9781424472062
ISSN	10893539
e-ISBN	9781424472079
DOI	10.1109/TEST.2010.5699250
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-11-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Accuracy Measurement Testing Mathematical model Circuit faults Analytical models
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis

Identifying redundant gate replacements in verification by error modeling

Silicon diagnosis

Microprocessor system failures debug and fault isolation methodology

Finding defects with fault models

Multiplets, models, and the search for meaning: improving per-test fault diagnosis

Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults

Logic diagnosis-diversion or necessity?

Enhancing BIST based single/multiple stuck-at fault diagnosis by ambiguous test set

Improving fault diagnosis accuracy by automatic test set modification

Similar Documents

Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis

Identifying redundant gate replacements in verification by error modeling

Silicon diagnosis

Microprocessor system failures debug and fault isolation methodology

Finding defects with fault models

Multiplets, models, and the search for meaning: improving per-test fault diagnosis

Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults

Logic diagnosis-diversion or necessity?

Enhancing BIST based single/multiple stuck-at fault diagnosis by ambiguous test set

Improving fault diagnosis accuracy by automatic test set modification