NDLI: IC mixed-signal BIST: separating facts from fiction

Content Provider	IEEE Xplore Digital Library
Author	Sunter, S.K.
Copyright Year	2002
Abstract	Summary form only given. BIST, by definition, requires on-chip generation of the stimulus, and on-chip analysis of the response, sufficient to produce a pass/fail result or a series of bits that any tester can compare bit-wise to the expected bit values. Many so-called on-chip mixed-signal built-in self-test (MS-BIST) approaches in fact require the ATE to supply the stimulus (analog waveform, or sigma-delta bit stream), or perform some response analysis (DSP, histogram processing, or RMS calculation), especially when >10 bits linearity is being tested. For MS-BIST to be technically and economically successful, it must test all key parameters, at-speed, in a test time comparable to that of mixed-signal ATE, with less than 1-2K gates, and permit new types of tests (and higher accuracy tests) to be added post-silicon -presently this is only available in fiction. For MS-BIST to become fact, it will have to evolve gracefully and gradually from partitioned test resources. New DFT and test methods that minimize on-chip circuitry will be implemented first, and then the on-chip portion will increase as each component of the test circuitry and method is proven in production.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Philadelphia Sect
File Size	92895
File Format	PDF
ISBN	0780375424
ISSN	10893539
DOI	10.1109/TEST.2002.1041911
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-10-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit testing Failure analysis Delta-sigma modulation Performance evaluation Performance analysis Digital signal processing Histograms Linearity Automatic testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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