NDLI: Evaluating ATE features in terms of test escape rates and other cost of test culprits

Content Provider	IEEE Xplore Digital Library
Author	Gatej, J. Lee Song Pyron, C. Raina, R.
Copyright Year	2002
Description	Author affiliation: Teradyne Inc., Agoura Hills, CA, USA (Gatej, J.; Lee Song)
Abstract	For years, there has been an ongoing debate in the industry regarding the effectiveness and costs associated with functional versus DFT-oriented testing and ATE. To answer important questions that arise from the functional vs. DFT debate, we consider actual production data analysis to evaluate the value of functional and DFT tests. Production test data from 10, 000 parts randomly sampled from over 1 million total datalogs of the Motorola MPC7410 microprocessor, a high-volume design, is used to evaluate the value of ATE features in terms of test escape rates across different tests. We also examine the value of features that cannot necessarily be quantified in terms of test escape rates. This work will help to provide some insight into how to lower the cost of test by making the right tradeoffs in terms of ATE features without compromising overall test coverage and quality.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Philadelphia Sect
Starting Page	1040
Ending Page	1049
File Size	695833
Page Count	10
File Format	PDF
ISBN	0780375424
ISSN	10893539
DOI	10.1109/TEST.2002.1041860
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-10-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Production Integrated circuit testing Design for testability Microprocessors Data analysis Manufacturing automation Automatic test equipment Modems Throughput
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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