NDLI: Mixed-signal BIST: fact or fiction

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Mixed-signal BIST: fact or fiction

Mixed signal BIST: fact or fiction

Mixed-signal BIST: fact or fiction

IC mixed-signal BIST: separating facts from fiction

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Mixed-signal BIST: fact or fiction

Content Provider	IEEE Xplore Digital Library
Author	Arabi, K.
Copyright Year	2002
Abstract	Summary form only given. Most of today's SoCs embed complex analog and mixed-signal cores. BIST has been seen as one of the most promising potential solutions for embedded mixed-signal cores. But, the viability of mixed-signal BIST as a credible and general-purpose test solution has always been questioned for the past decade. It has been subject to many success stories and several failures and disappointments, but a standard solution has not emerged yet. This panel aims at highlighting challenges of designing a practical mixed-signal BIST solution and tackles its viability as a general-purpose solution for embedded mixed-signal cores. The panel aims at discussion of issues related to mixed-signal BIST. This panel will help the industry focusing on the most promising mixed-signal BIST solutions.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Philadelphia Sect
File Size	88609
File Format	PDF
ISBN	0780375424
ISSN	10893539
DOI	10.1109/TEST.2002.1041908
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-10-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit testing Costs Degradation Process design Calibration Feedback loop Circuit optimization Semiconductor device measurement Design engineering
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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