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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Eckermann, J. Mehmood, S. Davies, H.M. Lavery, N.P. Brown, S.G.R. Sienz, J. Jones, A. Sommerfeld, P. |
| Copyright Year | 2013 |
| Description | Author affiliation: Coll. of Eng., Swansea Univ., Swansea, UK (Sienz, J.) || Electron. Motion Syst. UK Ltd., Swansea, UK (Sommerfeld, P.) |
| Abstract | The aim of this investigation was to understand the effect of temperature fluctuations on a number of solders used for varying joint configurations. Three different joint assemblies (a ball joint, a test specimen joint and finger lead joint) were chosen to simulate the creep and fatigue behaviours of various solder alloys including SAC105, SAC305, SAC405 and Sn-36Pb-2Ag. Both the impacts of thermal power cycles (80 to 150 °C) and thermal sh°Ck cycles (-40 to 125 °C) on solders were simulated by using the constitutive equation based on Anand's viscoplasticity model. From these results, lifetime-predictions of solder joints were derived using Coffin Manson pr°Cedures. |
| Sponsorship | IEEE Components, Packaging Manuf. Technol. Soc. |
| Starting Page | 1 |
| Ending Page | 8 |
| File Size | 1484037 |
| Page Count | 8 |
| File Format | |
| ISBN | 9781467361385 |
| e-ISBN | 9781467361392 |
| DOI | 10.1109/EuroSimE.2013.6529901 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-04-14 |
| Publisher Place | Poland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Computational modeling Lead Abstracts Copper Stress Finite element analysis |
| Content Type | Text |
| Resource Type | Article |
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