NDLI: Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures

Content Provider	IEEE Xplore Digital Library
Author	Banerjee, A. Sen, S. Devarakond, S.K. Chatterjee, A.
Copyright Year	2011
Description	Author affiliation: School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, USA (Banerjee, A.; Sen, S.; Devarakond, S.K.; Chatterjee, A.)
Abstract	Low cost diagnosis of RF systems has become an important problem due to increased process variability effects on the performance of RF devices and the need to ramp-up RF IC yield rapidly. In the recent past, there has been work on diagnosing RF device model parameters from random “frequency-rich” test stimulus. In this paper, we develop a novel test stimulus generation approach which produces a compact, deterministic test stimulus in such a way that the RF DUT model parameters can be computed directly from the DUT response (called the DUT signature). This is achieved through use of a non-linear solver that adjusts the DUT model parameters iteratively until the model response to the applied test matches the observed DUT test response signature. It is shown that a small set of optimized tones in the frequency domain or an optimized transient waveform in the time domain can be used as test stimulus. It is shown how the use of embedded sensors in the RF design can expedite model parameter diagnosis. The practicality and accuracy of the proposed diagnosis approach is shown through simulations and hardware measurements.
Starting Page	58
Ending Page	63
File Size	1293453
Page Count	6
File Format	PDF
ISBN	9781612846576
ISSN	10930167
e-ISBN	9781612846569
DOI	10.1109/VTS.2011.5783755
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-05-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Mathematical model Computational modeling Transmitters Radio frequency Receivers Data models Mixers
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Accurate signature driven power conscious tuning of RF systems using hierarchical performance models

DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules

VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests

Modeling and analysis of nonlinearities and bandwidth limitations in RF receivers

Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis

Computing RF propagation for use in simulation, modeling, and analysis

Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits

Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures

Similar Documents

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Accurate signature driven power conscious tuning of RF systems using hierarchical performance models

DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules

VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests

Modeling and analysis of nonlinearities and bandwidth limitations in RF receivers

Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis

Computing RF propagation for use in simulation, modeling, and analysis

Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits

Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures