NDLI: Accelerated tests to determine the reliability of the cable-encapsulant interface

Content Provider	IEEE Xplore Digital Library
Author	Bhakta, S.D. Austin, M.
Copyright Year	2004
Description	Author affiliation: Itron, Waseca, MN, USA (Bhakta, S.D.; Austin, M.)
Abstract	Encapsulants are mainly used with the cable in various outdoor products, to act as barriers against the operating environment. In some applications, the encapsulants can also be used to provide strain relief for the cable. The reliability of the cable-encapsulant interface is critical for product functionality as well as its long-term reliability. The reliability of this interface depends on the cable and encapsulant chemistry, their interaction, process conditions and other properties like the glass transition temperature (T/sub g/), hardness, coefficient of thermal expansion (CTE) etc. This reliability is usually determined as part of the final product tests. This is very time-consuming and can lead to appreciable loss of design time, especially when failures are discovered at the end. This study has developed quick screening tests which can optimize the process conditions and reasonably determine the reliability of the cable-encapsulant interface, without testing the entire product. The failure at this interface is mainly due to cracking of the cable. The failure mechanism is influenced by the exothermic reaction, cure temperature, hardness and adhesive properties of the encapsulant. The results of these tests have also been correlated to conventional accelerated product tests like ALT, 85/85 to determine their product applicability. Thereby, these tests could be used as a screening tool for the various cable-potting combinations at the start of the design, thus reducing the design time and achieving the required reliability and optimum process conditions.
Sponsorship	IEEE Reliability Soc. Electron. Div., American Soc. for Quality AIAA Reliability Div., American Soc. for Quality IEST QC & RE Div., IIE SAE International SOLE International Soc. of Logistics Soc. for Reliability Eng. System Safety Soc
Starting Page	330
Ending Page	334
File Size	396814
Page Count	5
File Format	PDF
ISBN	0780382153
DOI	10.1109/RAMS.2004.1285470
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Life estimation Testing Cable shielding Capacitive sensors Temperature Moisture Adhesives Thermal expansion Failure analysis Absorption
Content Type	Text
Resource Type	Article

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