NDLI: Planning of step-stress accelerated degradation test

Content Provider	IEEE Xplore Digital Library
Author	Tang, L.C. Yang, G.Y. Xie, M.
Copyright Year	2004
Description	Author affiliation: National Univ. of Singapore, Singapore (Tang, L.C.; Yang, G.Y.; Xie, M.)
Abstract	Estimating the long term performance of highly reliable products has been a difficult problem as accelerated life testing (ALT), which involves testing at highly elevated stresses, often results in too few failures for drawing useful inferences. To overcome this problem, accelerated degradation testing (ADT) has been proposed as a means to predict performance for highly reliable products. It requires one to identify a performance measure that would exhibit degradation and to monitor it over time. Product reliability can then be inferred from the degradation paths without the need of observing actual failures. Although physical failures are not needed in ADT, one usually defines failure as the first time when the degradation process exceeds a pre-specified threshold, so that the degradation path can be correlated to product reliability. As a result, reliability information of a product is embedded in degradation paths of units tested under ADT. In this paper, we look into planning of an ADT in which the test stress is increased in steps from lower stress to higher stress during the test, so that specimens are gradually conditioned to the stressed environment thus avoiding over-stressing. Our objective is to minimize the cost of testing, which is a function of sample size, test duration and number of inspections, as well as obtaining a reliability estimate of a requisite level of precision. Data from degradation paths are used to characterize the appropriate stochastic model underlying the product degradation process. We then derive the maximum likelihood estimators and the mean life at the use stress and its asymptotic variance. This variance is then used as a constraint, in a test plan which minimizes the testing cost. The optimal test plan gives the optimal sample size, number of inspections at each intermediate stress level and number of total inspections.
Sponsorship	IEEE Reliability Soc. Electron. Div., American Soc. for Quality AIAA Reliability Div., American Soc. for Quality IEST QC & RE Div., IIE SAE International SOLE International Soc. of Logistics Soc. for Reliability Eng. System Safety Soc
Starting Page	287
Ending Page	292
File Size	353425
Page Count	6
File Format	PDF
ISBN	0780382153
DOI	10.1109/RAMS.2004.1285462
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Life estimation Degradation Stress Inspection Life testing Time measurement Condition monitoring Cost function Stochastic processes Maximum likelihood estimation
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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