NDLI: An alternate analysis of a 2x2 DOE using a contour plot of Weibull joint parameter confidence regions

Content Provider	IEEE Xplore Digital Library
Author	Ware, E.A. Cooke, D.J.
Copyright Year	2004
Description	Author affiliation: Guidant, St. Paul, MN, USA (Ware, E.A.; Cooke, D.J.)
Abstract	Before beginning an accelerated test program for implantable cardiac defibrillator/pacemaker leads, an initial phase of testing was performed to determine if test stations and operators could be used interchangeably. DOE and Monte Carlo simulations were used to set up the 2/spl times/2 test matrix and determine if the test would produce sufficient data. The Weibull analysis methods, including the contour plot, proved to be useful for analyzing the fatigue failure data as well as providing some insight to the analysis methods. The test results demonstrated no difference between the four runs at the 85% confidence level; however, one run was subtly different from the others. A subsequent investigation into the combined data indicated that the three parameter Weibull distribution is more suitable than the two parameter Weibull distribution. The two parameter Weibull must be used for the individual runs, due to the smaller samples sizes, even though the three parameter distribution may represent the best fit to the total population. The observed run-to-run variation may partially be due to the choice of the simpler two parameter Weibull distribution. It is concluded that the effects of test station and operator on Weibull parameters /spl beta/ and /spl eta/, are not significant at the 85% confidence level (this conclusion also holds for higher confidence levels because the intersecting area increases as the confidence level increases). It is also concluded that the three parameter Weibull model yields a better fit than the two parameter Weibull model, for this particular lead specimen, this test method, and when the sample size is sufficient.
Sponsorship	IEEE Reliability Soc. Electron. Div., American Soc. for Quality AIAA Reliability Div., American Soc. for Quality IEST QC & RE Div., IIE SAE International SOLE International Soc. of Logistics Soc. for Reliability Eng. System Safety Soc
Starting Page	335
Ending Page	339
File Size	433293
Page Count	5
File Format	PDF
ISBN	0780382153
DOI	10.1109/RAMS.2004.1285471
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	US Department of Energy Testing Failure analysis Weibull distribution Life estimation Pacemakers Performance evaluation Data analysis Fatigue Time of arrival estimation
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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