NDLI: An accelerated life testing model involving performance degradation

Content Provider	IEEE Xplore Digital Library
Author	Zhao, W. Elsayed, E.A.
Copyright Year	2004
Description	Author affiliation: ReliaSoft Corp., Tucson, AZ, USA (Zhao, W.)
Abstract	Competing risk problems involving degradation failures are becoming increasingly common and important in practice. In this paper, we investigate the modeling of competing risk problems involving both catastrophic and degradation failures under accelerated conditions. By modeling the degradation process as a Brownian motion process for which the first passage time to a boundary is considered as the soft failure, and by modeling hard failures as a Weibull distribution enable us to model accelerated testing in a natural way, make inferences about the parameters of the degradation process and predict the reliability of products at the operating conditions. The methodology is demonstrated and validated using a real case study.
Sponsorship	IEEE Reliability Soc. Electron. Div., American Soc. for Quality AIAA Reliability Div., American Soc. for Quality IEST QC & RE Div., IIE SAE International SOLE International Soc. of Logistics Soc. for Reliability Eng. System Safety Soc
Starting Page	324
Ending Page	329
File Size	594783
Page Count	6
File Format	PDF
ISBN	0780382153
DOI	10.1109/RAMS.2004.1285469
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Life estimation Life testing Degradation Acceleration Predictive models Electrical resistance measurement Shape measurement Time measurement Weibull distribution
Content Type	Text
Resource Type	Article

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