NDLI: Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes

Content Provider	IEEE Xplore Digital Library
Author	Sheng-Tsaing Tseng Balakrishnan, N. Chih-Chun Tsai
Copyright Year	1963
Abstract	Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more appropriately modeled by a gamma process which exhibits a monotone increasing pattern. Hence, in practice, designing an efficient SSADT plan for a gamma degradation process is of great interest. In this paper, we first introduce the SSADT model when the degradation path follows a gamma process. Next, under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings such as sample size, measurement frequency, and termination time are obtained by minimizing the approximate variance of the estimated MTTF of the lifetime distribution of the product. Finally, an example is presented to illustrate the proposed method.
Sponsorship	IEEE Reliability Society
Starting Page	611
Ending Page	618
Page Count	8
File Size	243251
File Format	PDF
ISSN	00189529
Volume Number	58
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation Life estimation Life testing Frequency estimation Fatigue Cost function Frequency measurement Size measurement Time measurement Lifetime estimation Wiener process Gamma process optimal design step-stress accelerated degradation tests total experimental cost
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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