NDLI: Single event effects on hard-by-design latches

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2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2011 12th European Conference on Radiation and Its Effects on Components and Systems

2009 European Conference on Radiation and Its Effects on Components and Systems

2008 European Conference on Radiation and Its Effects on Components and Systems

2007 9th European Conference on Radiation and Its Effects on Components and Systems

Table of contents

RADECS 2007 overview

RADECS 2007 comments by the Editors

Conference committee

Official reviewers list RADECS 2007

Short course program

The LHC Power Converters and their radiation tolerance

Hunt for black holes with the INTEGRAL space gamma-ray observatory

The Mysterious Story of Lapérouse Shipwreck

The new JEDEC JESD89A Test Standard — How is it different than the old one and why should we use it?

Addressing the effects of atmospheric radiation on avionics, international electrotechnical commission technical specification

Neutrons for Science

RADECS 2007 statistics

RADECS 2007 awards

RADECS 2007 Jean-Marie Palau awards

Radiation effects in future electronics from device to systems — Roundtable report

First announcement RADECS 2009

Tungsten-filled silicone composites for moderating proton radiation effects in electronics

System knowledge-based techniques against SEUs for adaptive filters

Single event burnout as the failure mode for a low voltage MOSFET driver

Scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems

Total dose effects in op-amps with compensated input stages

Channel hot carrier stress on irradiated 130-nm NMOSFETs: Impact of bias conditions during X-ray exposure

Radiation response of SiGe BiCMOS mixed-signal circuits intended for emerging lunar applications

Source dependence and technology scaling effects on the radiation tolerance of SiGe HBTs at extreme dose and fluence levels

Effects of guard bands and well contacts in mitigating long SETs in advanced CMOS processes

Temperature effect on the heavy-ion induced Single-Event Transients propagation on a CMOS Bulk 0.18 µm inverters chain

Probing SET sensitive volumes in linear devices using focused laser beam at different wavelengths

Traditional methods shortfall in predicting modern microelectronics behavior in space

Use of code error and beat frequency test method to identify single event upset sensitive circuits in a 1GHz analog to digital converter

Effect of ion energy on charge loss from Floating Gate memories

Heavy ion testing and 3D simulations of Multiple Cell Upset in 65nm standard SRAMs

Total dose effects on error rates in linear bipolar systems

SEE-inducing effects of cosmic rays at the High-Altitude Research Station Jungfraujoch compared to accelerated test data

Comprehensive SEE characterization of 0.13µm flash-based FPGAs by heavy ion beam test

The experience of starting-up a radiation test at the 18MeV cyclotron in the Spanish National Accelerators Center

SEE sensitivity of a COTS GaN transistor and silicon MOSFETs

Radiation effects on MRAM

Heavy ion SEE studies on 4-Gbit NAND-Flash memories

Experimental study and analysis of soft errors in 90nm Xilinx FPGA and beyond

Degradation of RH1056 parameters at low total dose

Degradation of capacitor-based isolation amplifiers under neutron and gamma radiation

Designing the dependable multiprocessor space experiment

Compendium of TID and SEL test results for various candidate spacecraft electronics

Radiation testing of commercial-off-the-shelf GPS technology for use on low earth orbit satellites

Low cost TID testing of COTS components

Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application

Component tests for the PRISMA spacecraft

Cryo-Irradiation tests of magneto-electrical components used for the James Webb Space Telescope

A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5

Analog Single Event Transient susceptibility of an SOI operational amplifier for use in low-temperature radiation environments

The role of water in the radiation response of wet and dry oxides

Total Ionizing Dose effects on 4Mbit Phase Change Memory arrays

Charge yield and total ionizing dose measurements

Electrostatic mechanisms responsible for device degradation in AlGaN/AlN/GaN HEMTs

A design of an irradiation beamline for target station 2, ISIS

Charge-collection and single-event upset measurements at the ISIS neutron source

CARMEN/MEX test board for the study of radiation effects on electronic components aboard JASON-2 and SAC-D satellites

Test procedures for proton-induced single event latchup in space environments

SEB characterisation of commercial power MOSFETs with backside laser and heavy ions of different ranges

Radiation test challenges for scaled commercial memories

Direct data assimilation over solar cycle time-scales to improve proton radiation belts models

Observations of internal charging and outer-belt electron enhancements from Giove-A

Random telegraph signals in proton irradiated CCDs and APS

Stabilization of fiber Bragg gratings against gamma radiation

Radiation-resistant erbium-doped fiber for spacecraft applications

Optical absorption in commercial single mode optical fibres in a high energy physics radiation field

Radial distribution of proton-induced effects in erbium-doped optical fibers: micro-luminescence study

Infrared spectral dependencies of pulsed X-ray radiation-induced attenuation in single-mode optical fibers

Effectiveness of internal vs. external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis

Soft errors in SRAM-FPGAs: A comparison of two complementary approaches

Radiation effects in piezoelectric sensor

Proton and gamma radiation of 0.13 µm 200 GHz NPN SiGe:C HBTs featuring an airgap deep trench isolation

Study of single-event transients in high-speed operational amplifiers

Evaluation of recent technologies of non-volatile RAM

Investigating degradation mechanisms in 130 nm and 90 nm commercial CMOS technologies exposed to up to 100 Mrad ionizing radiation dose

Total dose radiation effect simulations on a high-precision data acquisition system

Effects of TID on transistor parameters of dc-dc converters

Single event effects on hard-by-design latches

Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs

Highlights of laser testing capabilities regarding the understanding of SEE in SRAM based FPGAs

Analytical analysis of the MCUs sensitiveness of TMR architectures in SRAM-based FPGAs

New analytical solutions of the diffusion equation available to radiation induced substrate currents Modeling

Simulation tool for the prediction of heavy ion cross section of innovative 130 nm SRAMs

A new mitigation approach for soft errors in embedded processors

Annealing of Static data Errors in NAND-Flash memories

STARDUST. A code for the simulation of particle tracks on arrays of sensitive volumes with substrate diffusion currents

Experimental verification of Single Event interconnect crosstalk in a 90 nm CMOS technology

Webcam observations of SEE events at the Jungfraujoch research station

Ion track structure and dynamics in SiO

Effects of non-penetrating lithium-ion radiation on Si solar cells

Effect of simulated space radiation on solid-state Brillouin phase conjugate mirrors

Comparison between point defect generation by γ-rays in bulk and fibre samples of high purity amorphous SiO

Observation and modeling of currents induced by14 MeV neutron recoils in dielectrics at high neutron fluxes

BPW34 commercial p-i-n diodes for high-level 1-MeV neutron equivalent fluence monitoring

Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization

Qualification methodology for sub-micron ICs at the Low Noise Underground Laboratory of Rustrel

Real-time fibered optically stimulated luminescence dosimeter based on SrS:Ce,Sm phosphor

Interface trap model for the low-dose-rate effect in bipolar devices

SEGR study on Power MOSFETs: Multiple impacts assumption

Modeling temperature effects of thick oxide $^{60}Co$ induced degradation under low electric field. Hardness assurance implications

Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits

Impact of magnetic storms on the dark current of the space infrared camera ISO/ISOCAM

Low temperature alpha particle irradiation of a STAR1000 CMOS APS

Influence of fiber composition and grating fabrication on the radiation sensitivity of fiber Bragg gratings

Proton irradiation effects on InAs / InP quantum dash laser diodes emitting at 1.55 µm

Comparison of gamma and proton-induced radiation damage in long-wavelength VCSELs

Effect of ionizing radiation on the performance of volume holographic elements

On the use of photobleaching and thermal annealing to recover the optical transmission in irradiated pure silica fibres

High level gamma and neutron irradiation of silica optical fibers in CEA OSIRIS nuclear reactor

Quenching of impact ionization in heavy ion induced tracks in wide bandwidth Si Avalanche Photodiodes

Fine-grain SEU mitigation for FPGAs using Partial TMR

Tbulk-BICS: A built-in current sensor robust to process and temperature variations for SET detection

Total ionization dose effects and single-event effects studies of a 0.25 µm Silicon-On-Sapphire CMOS technology

2005 8th European Conference on Radiation and Its Effects on Components and Systems

Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605)

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3)

RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems

Single event effects on hard-by-design latches

Content Provider	IEEE Xplore Digital Library
Author	Liang Wang Yuhong Li Suge Yue Yuanfu Zhao Long Fan Liquan Liu
Copyright Year	2007
Description	Author affiliation: Beijing Microelectron. Technol. Inst., Beijing, China (Liang Wang; Yuhong Li; Suge Yue; Yuanfu Zhao; Long Fan; Liquan Liu)
Abstract	Chip with four kinds of hard-by-design latches and an unhardened one is fabricated with a commercial 0.18 mum process, and tested for their SEL and SEU susceptibility. Some of the latches are tested with heavy-ions for the first time. Simulation and test results prove that the hardening methods we used are very effective. Discussions and comparisons are made among test results.
Starting Page	1
Ending Page	4
File Size	2423972
Page Count	4
File Format	PDF
ISBN	9781424417049
ISSN	03796566
DOI	10.1109/RADECS.2007.5205498
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-09-10
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Latches Single event upset Circuit testing Redundancy Epitaxial layers Inverters Voltage Random access memory Circuit simulation Microelectronics heavy ion Single Event Effect SEU SEL latches Hard-by-Design
Content Type	Text
Resource Type	Article

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