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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gattiker, A. Nassif, S. Dinakar, R. Long, C. |
| Copyright Year | 2001 |
| Description | Author affiliation: IBM Austin Res. Lab., TX, USA (Gattiker, A.) |
| Abstract | This paper presents a means for estimating parametric timing yield and guiding robust design for-quality in the presence of manufacturing and operating environment variations. Dual emphasis is on computational efficiency and providing meaningful robust-design guidance. Computational efficiency is achieved by basing the proposed methodology on a post-processing step applied to the report generated as a by-product of static timing analysis. Efficiency is also ensured by exploiting the fact that for small processing/environment variations, a linear model is adequate for capturing the resulting delay change. Meaningful design guidance is achieved by analyzing the timing-related influence of variations on a path-by-path basis, allowing designers perform a quality-oriented design pass focused on key paths. A coherent strategy is provided to handle both die-to-die and within-die variations. Examples from a PowerPC microprocessor illustrate the methodology and its capabilities. |
| Sponsorship | IEEE Tech. Committee on VLSI Design (TCVLSI) |
| Starting Page | 437 |
| Ending Page | 442 |
| File Size | 560757 |
| Page Count | 6 |
| File Format | |
| ISBN | 0769510256 |
| DOI | 10.1109/ISQED.2001.915268 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2001-03-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Timing Yield estimation Delay estimation Circuit simulation Robustness Pulp manufacturing Microprocessors Fluctuations Temperature Dielectrics |
| Content Type | Text |
| Resource Type | Article |
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