NDLI: Noise model for multiple segmented coupled RC interconnects

Content Provider	IEEE Xplore Digital Library
Author	Kahng, A.B. Muddu, S. Pol, N. Vidhani, D.
Copyright Year	2001
Description	Author affiliation: Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA (Kahng, A.B.)
Abstract	The performance of high-speed VLSI circuits is increasingly limited by interconnect coupling noise. We present simple and improved analytical models for noise phenomena due to coupling capacitance. We extend the /spl Pi/ model presented previously to accommodate a segmented aggressor. We also include a linear driver resistance in the modeling of both victims and aggressors to measure their estimate on peak noise. Finally, we extend this model to multiple segmented aggressors by superposing noise contributions of individual aggressors and sweeping the result in the time domain to determine peak noise (in contrast to adding the individual peak noise values for individual aggressors). Accuracy in the results depends greatly on actual positioning of victim-aggressor overlaps. We find that previous models that assume aggressors run parallel to the victim net for its entire length do not yield peak noise results nearly as close to SPICE-computed values. We also find that inclusion of driver resistance in the model improves accuracy. Our noise model for a single segmented aggressor is within /spl sim/16% of SPICE. Results for two segmented aggressors are within acceptable tolerances with respect to SPICE, but error increases with the number of aggressors. We note that these results are almost always pessimistic.
Sponsorship	IEEE Tech. Committee on VLSI Design (TCVLSI)
Starting Page	145
Ending Page	150
File Size	533186
Page Count	6
File Format	PDF
ISBN	0769510256
DOI	10.1109/ISQED.2001.915219
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit noise Coupling circuits Integrated circuit interconnections SPICE Very large scale integration Analytical models Capacitance Driver circuits Electrical resistance measurement Noise measurement
Content Type	Text
Resource Type	Article

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