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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wei-Te Lin Tai-Haur Kuo |
| Copyright Year | 2013 |
| Description | Author affiliation: Nat. Cheng Kung Univ., Tainan, Taiwan (Wei-Te Lin; Tai-Haur Kuo) |
| Abstract | Current-steering DACs are generally used in high-speed signal generation. The critical challenges for DACs are to realize the highest-possible spurious-free dynamic range (SFDR) and inter-modulation distortion (IMD) at the widest possible signal bandwidth. However, the above performances are degraded by many nonlinear causes, e.g., parasitic capacitor-induced finite output impedance [1], current-source (CS) mismatch, and input-code dependent switching transients [2]. While CS mismatch and input-code dependent switching transients result in distortion tones, the parasitic capacitor-induced finite output impedance further limits the high-linearity bandwidth and causes the SFDR to drop at high signal frequencies. In addition, low power consumption and small area are important factors for low-power applications and reduced implementation cost, respectively. |
| Sponsorship | IEEE Solid-State Circuits Soc. |
| Starting Page | 474 |
| Ending Page | 475 |
| File Size | 335253 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781467345156 |
| ISSN | 01936530 |
| e-ISBN | 9781467345163 |
| DOI | 10.1109/ISSCC.2013.6487821 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-02-17 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Bandwidth CMOS integrated circuits Transistors Layout Frequency measurement Nonlinear distortion |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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