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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lim Wee Teck |
| Copyright Year | 2002 |
| Description | Author affiliation: SCG Ind., ON Semicond., Negeri Sembilan, Malaysia (Lim Wee Teck) |
| Abstract | This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented. |
| Sponsorship | Mems Technol.(M) Sdn, Bhd Kriptic Devices (M) Sdn Bhd IEEE Electron Devices Soc |
| Starting Page | 409 |
| Ending Page | 414 |
| File Size | 420225 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780375785 |
| DOI | 10.1109/SMELEC.2002.1217854 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-12-19 |
| Publisher Place | Malaysia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Vehicles Circuit testing Integrated circuit testing Semiconductor device testing System testing Packaging Analog integrated circuits Voltage Costs Assembly systems |
| Content Type | Text |
| Resource Type | Article |
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