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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Li, S.S. Stanbery, B.J. Huang, C.H. Chang, C.H. Chang, Y.S. Anderson, T.J. |
| Copyright Year | 1996 |
| Description | Author affiliation: Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA (Li, S.S.) |
| Abstract | A new nondestructive contactless dual-beam optical modulation (DBOM) technique has been developed for the characterization of effective excess carrier lifetimes in CuInGaSe/sub 2/ thin-film solar cells. Developed originally for lifetime measurement of SOI wafers, the technique represents a novel tool with the capabilities of direct measurement of the lifetime effects of intermediate processing steps during device fabrication without the confounding effects that subsequent processes might have on the final device characteristics. This is demonstrated in a controlled experiment intended to elucidate the mechanisms whereby CBD CdS processes improve device performance and to compare the CBD process with an MOCVD dry process. Areal mapping of excess carrier lifetimes across the samples is used to exhibit the substantial inhomogeneity of lifetime even within very high quality sample, demonstrating another capability of DBOM applicable to quality assessment and process optimization. |
| Starting Page | 821 |
| Ending Page | 824 |
| File Size | 366141 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780331664 |
| ISSN | 01608371 |
| DOI | 10.1109/PVSC.1996.564254 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1996-05-13 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Buffer layers Charge carrier lifetime Optical buffering Computational Intelligence Society Optical films Optical modulation Photovoltaic cells Optical materials Optical beams Zinc oxide |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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