NDLI: Charge collection efficiency measurements for segmented silicon detectors irradiated to $1x10^{16}$ n $cm^{−2}$

Content Provider	IEEE Xplore Digital Library
Author	Casse, G. Affolder, A. Allport, P.P.
Copyright Year	2007
Description	Author affiliation: Univ. of Liverpool, Liverpool (Casse, G.; Affolder, A.; Allport, P.P.)
Abstract	Plans are well advanced for a phased upgrade program of the large hadron collider (LHC) at CERN. An improvement of nearly a factor of ten to reach a luminosity close to $10^{35}$ $cm^{2}$ $s^{-1}$ is the target of the upgraded machine, called the super LHC (SLHC). The innermost tracker devices in the SLHC will be exposed to hadron radiation doses in excess of $1times10^{16}$ $n_{eq}$ $cm^{-2}.$ The detectors to be used in the tracker system of the SLHC experiments need therefore to be qualified to these extreme fluences. Segmented n-strip silicon detectors made with thin (140 mum) and standard (300 mum) p-type substrates have been irradiated with neutrons to different fluences up to $1times10^{16}$ n $cm^{-2}$ and characterised in term of charge collection efficiency measurements using high speed (40 MHZ) analogue electronics. These measurements are the first direct comparison between the charge collection performances of thin and thick silicon microstrip devices as a function of different fluences relevant to future supercolliders. They also set a reference for the maximum collected charge by segmented sensors made in planar technologies (microstrip and pixel detectors) at these extreme doses, allowing for predictions on the functionality of silicon detectors that can operated in the inner tracking system of SLHC experiments.
Starting Page	96
Ending Page	99
File Size	167626
Page Count	4
File Format	PDF
ISBN	9781424409228
ISSN	10957863
DOI	10.1109/NSSMIC.2007.4436295
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Current measurement Charge measurement Silicon Detectors Large Hadron Collider Microstrip Target tracking Measurement standards Neutrons Velocity measurement
Content Type	Text
Resource Type	Article

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Charge Collection Efficiency Measurements for Segmented Silicon Detectors Irradiatedto $1times 10^{16} {hbox {n}} {hbox {cm}}^{-2}$

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Charge collection efficiency measurements for segmented silicon detectors irradiated to $1x10^{16}$ n $cm^{−2}$

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