NDLI: Charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

Content Provider	IEEE Xplore Digital Library
Author	Da Via, C. Bell, W.H. Berglund, P. Borchi, E. Borer, K. Bruzzi, M. Buontempo, S. Casagrande, L. Chapuy, S. Cindro, V. Dimcovski, Z. D'Ambrosio, N. de Boer, W. Dezillie, B. Esposito, A. Granat, V. Grigoriev, E. Heijne, E. Heising, S. Janos, S. Koivuniemi, J. Konotov, I. Li, Z. Lourenco, C. Mikuz, M. Niinikoski, T. Pagano, S. Palmieri, V. Paul, S. Pirollo, S. Pretzl, K. Ropotar, I. Ruggiero, G. Salmi, J. Seppa, H. Suni, I. Smith, K. Sonderegger, P. Valtonen, M. Zavrtanik, M.
Copyright Year	1999
Description	Author affiliation: RD39 Collaboration, CERN, Geneva, Switzerland (Da Via, C.)
Abstract	The charge collection efficiency (CCE) of high resistivity silicon detectors, previously neutron irradiated up to 2/spl times/10/sup 15/ n/cm/sup 2/, was measured at different cryogenic temperatures and different bias voltages. In order to study reverse annealing (RA) effects, a few samples were heated to 80/spl deg/C and kept at room temperature for several months after irradiation. For comparison other samples (NRA) where kept at -10 C after irradiation. The RA and NRA samples, measured at 250 V forward and reverse bias voltage, present a common temperature threshold at 150 K. Below 120 K the CCE is constant and ranges between 55% and 65% for the RA and NRA sample respectively. Similar CCE was measured for a device processed with low resistivity contacts (OHMIC), opening the prospect for a consistent reduction of the cost of large area particle tracking.
Starting Page	298
Ending Page	301
File Size	252289
Page Count	4
File Format	PDF
ISBN	0780350219
ISSN	10823654
DOI	10.1109/NSSMIC.1998.775148
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-11-08
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Conductivity Temperature Detectors Neutrons Current measurement Charge measurement Cryogenics Voltage Annealing
Content Type	Text
Resource Type	Article

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