NDLI: Validation of a PET Monte-Carlo simulator with random events and dead time modeling

Content Provider	IEEE Xplore Digital Library
Author	Le Meunier, L. Mathy, F. Fagret, P.D.
Copyright Year	2003
Description	Author affiliation: Lab d'Electron. et de Technol. de l'Inf., CEA, Centre d'Etudes Nucleaires de Grenoble, France (Le Meunier, L.; Mathy, F.)
Abstract	To perform Monte-Carlo simulations of PET tomographs, we used SimSET (a Simulation System for Emission Tomography). Since we need to estimate performance characteristics of different tomographs, this widely used simulation package had limited properties for our use. We integrated a module to generate random events from a singles simulation and we modeled dead time losses. The count rate model we used is based on Moisan & al's method (1997) developed for the Siemens HR+ scanner. We needed a reliable simulation tool, which could provide data such as scatter fraction, sensitivity, count rates or noise equivalent count rate (NEC). So, we carried out a two-steps validation of SimSET in 3D alone and with additional features. First, we compared results obtained with SimSET and with two other simulators (GePEToS, a PET simulator using Geant4 and a simulator developed by Adam & al. (1998)). We estimated energy spectrum and sensitivity to scattered events. Second, we compared our simulated data with experimental data obtained on two Siemens tomographs : the ECAT HR+ and the ECAT ACCEL. We determined scatter fraction, sensitivity (global and for each plane) and all the different count rates (true, scattered and random). We also calculated the NEC to completely validate this simulator. We found that SimSET and the features we integrated (random events and dead time losses) are rather in good agreement firstly with two other simulators and secondly with experimental data. Further validation is planned concerning spatial resolution and 2D mode.
Starting Page	1108
Ending Page	1112
File Size	318763
Page Count	5
File Format	PDF
ISBN	0780376366
DOI	10.1109/NSSMIC.2002.1239515
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-11-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Positron emission tomography Discrete event simulation Medical simulation Scattering Detectors Packaging National electric code Monte Carlo methods Solid modeling Spatial resolution
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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