NDLI: Considerations on the de-embedding of differential devices using two-port techniques

Content Provider	IEEE Xplore Digital Library
Author	Issakov, V. Wojnowski, M. Thiede, A. Weigel, R.
Copyright Year	2009
Description	Author affiliation: Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstr. 9, D-91058 Erlangen, Germany (Weigel, R.) \|\| Infineon Technologies AG, Am Campeon 1-12, D-85579 Neubiberg, Germany (Wojnowski, M.) \|\| Dept. of High-Frequency Electronics, University of Paderborn, Warburgerstr. 100, D-33098 Paderborn, Germany (Issakov, V.; Thiede, A.)
Abstract	Differential signaling is very common for high frequency integrated circuit design. Accurate multi-mode de-embedding at multigigahertz frequencies, however, is a major challenge. The differential and common-mode parameters can be obtained by converting the measured four-port nodal S-parameters into the mixed-mode form. Under certain conditions it is possible to separate the modes and consider only the entries corresponding to the differential S-parameters. This allows to reduce the measured 4×4 matrix to a 2×2 matrix and consider the differential device as a two-port network. Thus, the standard de-embedding techniques, derived for two-port networks, can be applied to differential S-parameters. The purpose of this paper is to investigate the applicability of this approach for on-wafer measurements. We describe analytically the conditions, under which this method is valid. As an example a 2:1 transformer, manufactured in Infineon's 0.13 µm CMOS process, has been characterized. On-chip de-embedding structures have been fabricated using the same process. The results obtained using Short-Open, Thru-Line and Thru-Line-Reflect de-embedding techniques are compared.
Starting Page	695
Ending Page	698
File Size	614144
Page Count	4
File Format	PDF
ISBN	9781424447480
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-09-29
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	EUMA
Subject Keyword	Frequency Scattering parameters Calibration Microwave devices Matrix converters CMOS process Millimeter wave measurements Microwave theory and techniques Integrated circuit technology Microwave technology
Content Type	Text
Resource Type	Article

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