NDLI: A Model and Verification for Temperature Dependency of the Noise in Large Size CCD Image Sensor

Content Provider	IEEE Xplore Digital Library
Author	Hoshino, K. Nishimura, T.
Copyright Year	2006
Description	Author affiliation: Imaging Syst. Dev. Sect., Sony Corp., Tokyo (Hoshino, K.)
Abstract	This paper describes the temperature dependence of the noise of a large size CCD image sensor used in a digital single-lens reflex camera. To clarify the temperature dependence of the noise, the CCD was cooled directly with a Peltier device. The change in noise after black correction of the actual experiment result was consistent with the Shockley-Read-Hall (SRH) model, confirming the validity of this model. Moreover, because the residual noise after black correction increased with temperature, the main factor is considered to be random noise. A comparison result of the two dimensional noise simulations as imaging picture and the actual image in the noise based on the SRH model. 2-D image simulations based on the SRH model agreed well with the experiment data, again confirming the model validity
Starting Page	3290
Ending Page	3293
File Size	337265
Page Count	4
File Format	PDF
ISBN	1424403901
ISSN	1553572X
DOI	10.1109/IECON.2006.347629
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-11-06
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature dependence Temperature sensors Charge-coupled image sensors Charge coupled devices Thermoelectric devices Noise level Heat sinks Cameras Noise cancellation Pixel
Content Type	Text
Resource Type	Article

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