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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Netzel, M. Lerner, R. Siemieniec, R. Lutz, J. |
| Copyright Year | 2002 |
| Description | Author affiliation: Dept. of Solid- State Electron., Technische Hochschule Ilmenau, Germany (Netzel, M.; Lerner, R.; Siemieniec, R.; Lutz, J.) |
| Abstract | The adjustment of emitter efficiency by variation of doping profiles or application of lifetime control techniques such as irradiation of electrons and helium are two generally recognized concepts for the improvement of power device characteristics. In this work both concepts were studied by use of device simulation for the development of an IGBT and freewheeling diode chipset for 3.3 kV. Simulations were performed using an extended recombination model and recombination center data taken from measurements at different irradiated devices. Finally, this lead to the manufacturing of an IGBT using low-emitter efficiency and an irradiated freewheeling diode. The experimental results are in good accordance with the previously performed simulations and give evidence of the capabilities of present device simulation tools. |
| Sponsorship | IEEE Electron Devices Soc. IEEE-Solid-State Circuits Soc |
| Starting Page | 167 |
| Ending Page | 170 |
| File Size | 749413 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780372352 |
| DOI | 10.1109/MIEL.2002.1003166 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-05-12 |
| Publisher Place | Yugoslavia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Diodes Insulated gate bipolar transistors Spontaneous emission Doping profiles Electron emission Helium Character recognition Performance evaluation Semiconductor device measurement Manufacturing |
| Content Type | Text |
| Resource Type | Article |
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